Fig. 1.
Morphological characterization of Ti3C2Tx MXene and (MXene/TAEA)n multilayers. a Schematic illustration of the LbL self-assembly of (MXene/TAEA)n multilayer films onto planar substrates. b AFM image of delaminated MXene flakes on a silicon wafer, and c corresponding height profiles at the edge of individual MXene flakes in (b). d The histogram of the lateral size of MXene flakes based on statistics from 150 individual flakes measured from AFM images. e AFM image of (MXene/TAEA)6 on a silicon wafer, and f corresponding height profiles at the edge of MXene flakes on the top layer of multilayers in (e) that were stacked on the next TAEA layer. g The histogram of the lateral size of the MXene flakes of (MXene/TAEA)6 based on the statistic of 150 individual flakes from AFM images