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. 2018 Feb 15;78(2):129. doi: 10.1140/epjc/s10052-018-5595-5

Table 3.

Post-fit yields of the tt¯ signal and background contributions. The yields represent the sum of the number of events in each of the eight analysis regions. Only the normalisation uncertainties are shown

Sample Post-fit yields
tt¯ 156,360±750
Single top 5700±930
W+bb/cc 7060±510
W+c 1650±550
W+light 1603±65
Z+jets 2770±710
Diboson 320±240
Multijet 6070±380
Total 181,600±1700
Data 181,536