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. 2019 May 8;10(5):310. doi: 10.3390/mi10050310

Figure 16.

Figure 16

Compact aberration-corrected spectrometer. (a) Scanning electron micrographs of a fabricated aberration-corrected off-axis metalens. (b) A regular Berry-phase lens and (c) an aberration-corrected metalens. The metalenses designed with focal length f = 40 mm and focusing angle a = 25 degrees at wavelength λ = 470 nm. The focusing planes for each case are indicated by bold lines; the dashed line in the left is horizontal and meant as a reference to the curved focal plane. (Reproduced from [107] with permission.)