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. Author manuscript; available in PMC: 2019 Jun 13.
Published in final edited form as: Microelectron Eng. 2018 Mar 28;195:41–49. doi: 10.1016/j.mee.2018.03.023

Fig. 7.

Fig. 7

(a) SEM micrograph of an Al-coated TF with a ring-shaped window milled on its surface. (b) Details of the window in panel (a); each subpanel shows the fiber rotated around its axis by an angle of 90° with respect to the previous subpanel. A stitching defect is evident in panel (b3–4). The legend in each panel highlights the plane of view position with respect to the TF cross section. The stitching defect has been indicated with a white arrow in panels b3 and b4.