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. 2019 May 16;12(10):1614. doi: 10.3390/ma12101614

Figure 4.

Figure 4

Top-view SEM images of (a) 3 wt% ITO NPs dispersed in the SiO2 layer; (b) size distribution and coverage of 3 wt% ITO NPs, respectively calculated using Image-J software on the SEM image.