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. 2019 Jun 13;19:103. doi: 10.1186/s12903-019-0810-9

Table 1.

Overall mean ± standard error (SE) and 95% confidence intervals of the fabrication methods

AMD mean ± SE MD mean ± SE MD 95% confidence intervals-Lower bound MD 95% confidence intervals-upper bound
CEREC inLAB 85 ± 2 μm* 53 ± 2 μm 43 μm 62 μm
LAVA milling center 133 ± 4 μm* 61 ± 3 μm 52 μm 71 μm

*significant difference