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. 2019 Jun 19;9:8735. doi: 10.1038/s41598-019-45448-w

Figure 3.

Figure 3

(a) Fe 2p XPS signal for Si−Me−Fc (continuous line) and Si−UA−Fc (dotted line) surfaces. (b) Si 2p levels for the pristine surface (broken-dotted line) and for Si−Me−Fc (continuous line) and Si−UA−Fc (dotted line) surfaces.