Figure 3.

The effect of morphology on carrier mobility and spin transport distance. AFM image of C₆₀ thin film (A). The relationship between grain size and film thickness, and the area of (111) Bragg scattering peak and film thickness (B). C₆₀ thickness dependence of MR with bias of 10 mV (C). [A&B&C reproduced from (Nguyen et al., 2013), with permission of American Physical Society] AFM images of F₁₆CuPc fabricated at RT and LT (D). Transfer curves of F₁₆CuPc-based OFET at RT and LT (E). [D&E reproduced from (Sun X. et al., 2016), with permission of John Wiley and Sons].