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. 2019 Jun 26;20(1):657–672. doi: 10.1080/14686996.2019.1621683

Figure 4.

Figure 4.

Diffractograms of CuO-ns and CuO-np samples. (◉) XRD data, (–) Rietveld refinement fit and Bragg position peaks. Insets show the mean shape of the structures.