Table 2.

The randomness test results for the DRAM PUF leveraging NIST test suit for temperature 25 ${}^{\circ }$C, 30 ${}^{\circ }$C, 35 ${}^{\circ }$C, 40 ${}^{\circ }$C under decay time 30 s. It should be noticed that as a weak PUF, the length of the output from the DRAM PUF cannot meet some of the tests in the National Institute of Standards and Technology (NIST) test suit, e.g., the length of the bit strings should be longer than ${10}^6$ for the Rank test. Therefore, we just listed the test results that meet the requirement. (N.O.T. is the Non Overlapping Template. FFT is the Fast Fourier Transform test.)

NIST Tests	Pi1				Pi2				Pd i3
	$25{}^{\circ }$C	$30{}^{\circ }$C	$34{}^{\circ }$C	$40{}^{\circ }$C	$25{}^{\circ }$C	$30{}^{\circ }$C	$34{}^{\circ }$C	$40{}^{\circ }$C	$25{}^{\circ }$C	$30{}^{\circ }$C	$34{}^{\circ }$C	$40{}^{\circ }$C
Frequency	-	-	100%	100%	-	-	97%	97%	-	-	99%	99%
Blcok Frequency	-	-	100%	99%	-	-	100%	97%	-	-	100%	99%
Cumulative Sums	-	-	100%	100%	-	-	99%	96%	-	-	98%	99%
Runs	-	-	100%	99%	-	-	99%	97%	-	-	98%	99%
longest Run	-	-	99%	99%	-	-	0%	98%	-	-	0%	99%
FFT	-	-	95%	98%	-	-	96%	99%	-	-	99%	100%
N.O.T.	-	-	47%	100%	-	-	59%	91%	-	-	98%	98%