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. 2019 Jun 25;10:1290–1302. doi: 10.3762/bjnano.10.128

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Copyright © 2019, Grünewald et al.

This is an Open Access article under the terms of the Creative Commons Attribution License (https://creativecommons.org/licenses/by/4.0). Please note that the reuse, redistribution and reproduction in particular requires that the authors and source are credited.

The license is subject to the Beilstein Journal of Nanotechnology terms and conditions: (https://www.beilstein-journals.org/bjnano/terms)

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(a) Generated VBs in the object plane of a Philips CM200 for the sinusoidal and saw-tooth pattern, respectively. The images are displayed in logarithmic intensity scale to visualize multiple diffraction orders with strongly varying intensity. The size of the doughnut-shaped beam profile increases with the topological charge l. Magnified sections for l = −2 to l = 2 for (b) sinusoidal and (c) saw-tooth patterns with linear intensity scale are compared with simulations. (b) The sinusoidal pattern shows good agreement, whereas for (c) a larger deviation is observed. (d) The azimuthally averaged intensities of the measured beams in (b) are plotted against the radial distance from the center of each beam.