Fig. 3.

TEM characterisation of MoS₂. a High-resolution TEM of suspended MoS₂. A hole in the monolayer introduced by knock-on damage during imaging is indicated (white arrow), where lattice fringes are absent. The boxed region has had an iterative nonlinear denoising filter applied to highlight the MoS₂ lattice and reduce shot noise⁵⁰. Scale bar 2 nm. b SAED pattern of suspended MoS₂ layers with a 100 nm diameter aperture showing single crystal long range order. Scale bar 1 nm⁻¹