Table 1. Measured electron source size (
) by a pinhole at the XSR beamline made as the vertical source size was changed using skew quadruples. Included are measurements by the ps-BPM system at the BMIT beamline of the electron source size (
), average source position (
), divergence (
), average angular position (
), and the average beam position ( + 
).
|
(µm) |
(µm) |
(µm) |
 (µrad) |
(µrad) |
+ (µm) |
|---|---|---|---|---|---|
| 83.6 | 98.0 ± 2.6 | 271 ± 8 | 21.11 ± 0.11 | 0.90 ± 0.61 | 294 ± 15 |
| 76.6 | 89.1 ± 2.8 | 277 ± 8 | 20.24 ± 0.08 | 0.53 ± 0.62 | 290 ± 16 |
| 70.7 | 84.2 ± 2.6 | 277 ± 8 | 19.41 ± 0.10 | 0.66 ± 0.63 | 294 ± 16 |
| 66.5 | 74.3 ± 3.1 | 283 ± 8 | 18.99 ± 0.08 | 0.33 ± 0.71 | 291 ± 18 |
| 65.2 | 75.3 ± 3.7 | 278 ± 8 | 18.80 ± 0.06 | 0.70 ± 0.65 | 297 ± 16 |
| 65.6 | 76.5 ± 2.1 | 276 ± 8 | 19.05 ± 0.10 | 0.73 ± 0.68 | 295 ± 17 |
| 82.4 | 96.1 ± 2.2 | 269 ± 8 | 21.02 ± 0.11 | 0.62 ± 0.62 | 285 ± 16 |
| 89.8 | 103.8 ± 3.1 | 266 ± 8 | 22.20 ± 0.15 | 0.80 ± 0.65 | 286 ± 16 |
| 98.2 | 111.8 ± 2.2 | 263 ± 8 | 23.56 ± 0.15 | 0.89 ± 0.62 | 286 ± 15 |
| 106.8 | 122.4 ± 1.4 | 261 ± 8 | 25.14 ± 0.12 | 0.76 ± 0.62 | 281 ± 15 |