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. 2019 Jul 8;10:3008. doi: 10.1038/s41467-019-10985-5

Fig. 3.

Fig. 3

Morphological characterization of perovskite layers: ad SEM top view images of the perovskite films with optimized treatment conditions. e AFM measurements (xy: 1 × 1 μm, z: 0 ± 90 nm) reveal increasing RMS surface roughness for surface-treated perovskite absorbers: f control, g IAI, h EAI, and i GuaI