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. 2019 Jul 11;9:10029. doi: 10.1038/s41598-019-46574-1

Figure 3.

Figure 3

Isolated atom distribution image of (a) Nd and (b) Si obtained from the iso-surface analysis with 1.40 at.% each atom. (c) Concentration profile of each element (Si, O, Nd) in a cluster of ~3-nm diameter.