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. 1965 Jul-Aug;69A(4):325–333. doi: 10.6028/jres.069A.033

Table 1.

Pressure induced changes in refractive index as measured with helium yellow radiation of 5875.62 Å

Material Refractive
index,
μHe
Specimen
thickness,
t0
Pressure,
P
Thickness
change,
−Δt/t0×103
Observed
change in
fringe number
ΔN
Change in
refractive
index
Δμ×105
Cm bars
KBr 1.560 0.3210 966.1 2.118 11.3 227
NaCl 1.546 .6748 963.6 1.348 21.6 115
LiF 1.392 .5683 963.2 .349 9.4 0
MgO 1.738 .3970 960.8 .190 6.8 −17
Diamond 2.418 .4037 960.0 .058 3.4 −11
Quartz:
ω 1.545 .5112 957.6 .944 6.9 103
ϵ 1.554 .5112 961.5 .948 7.5 107
Sapphire:
ω 1.769 .5659 961.8 .105 6.2 −14
ϵ 1.760 .5659 957.6 .105 6.2 −14
Fused SiO2 1.458 .4967 960.2 .865 7.3 83
BSC 517/645 1.517 .6693 960.1 .717 8.9 70
Plate glass 1.518 .6566 960.0 .723 9.1 69