Skip to main content
. 2019 Jun 12;12(12):1896. doi: 10.3390/ma12121896

Figure 5.

Figure 5

Field electron scanning electron microscopy (FE-SEM) of A4[Re6Q8L6]@SiO2 NPs, (a) K4[Re6S8(OH)6]@SiO2 (b) Cs1.68K2.32[Re6S8CN4(OH)2]@SiO2 NPs, Reprinted with permission from [81] (Langmuir 2010, 26, 18512–18518). Copyright (2010) American Chemical Society.