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. 2019 Jul 3;17:267–276. doi: 10.1016/j.isci.2019.06.042

Figure 4.

Figure 4

Morphological Characterizations of the Ru@SiO2 NPs

(A–E) (A) Transmission electron microscopic image, (B) high-angle annular dark-field scanning transmission electron microscopic image, and (C–E) the corresponding energy-dispersive X-ray spectroscopic elemental mappings of Ru@SiO2 NPs.