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. Author manuscript; available in PMC: 2020 Jun 1.
Published in final edited form as: IEEE Trans Nucl Sci. 2019 May 15;66(6):960–968. doi: 10.1109/TNS.2019.2917144

Fig. 2.

Fig. 2.

Schematic cross section of the DSSSD for TCAD transient current simulation. The simulated device is 300 μm thick with a pitch of 25 μm. The silicon substrate has n-type doping of 5.6×1011 cm−3. The transient currents collected on both the major and neighbor electrodes are calculated. The major collecting electrode is the electrode with a shorter distance from the initial charge cloud compared to the neighboring collecting electrode. Detailed simulation setup can be found from [18].