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. 2017 Jan 30;2(1):308–315. doi: 10.1021/acsomega.7b00015

Table 2. Morphology Parameters of 9ac Thin Films Determined by XRD Patterns.

compound d (Å) L (Å)a θ (deg)b l (nm)c
9a 17.0 16.9 ∼0 20.5
9b 31.0 36.6 32 24.7
9c 34.0 41.4 35 28.9
a

Defined as the distance between the terminal methyl groups in the alkyl chains in a DFT (B3LYP/6-31G(d))-optimized molecular structure.

b

Based on (d001) and the molecular length.

c

From the full width at half-maximum of (001) diffraction using the Debye–Scherrer formula.