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. 2018 Jan 30;3(1):1298–1303. doi: 10.1021/acsomega.7b02052

Figure 2.

Figure 2

(a) Top and (b) cross-sectional SEM image of MAP@KF4 (scale bar 5 μm and 500 nm, respectively). (c, d) Topographical and conductive AFM images of MAP@KF4 (bias = −1.5 V); image scale 5 μm × 5 μm. (e) Cross-sectional profile of height and current along the white line in images (c) and (d). (f) IV curve as a function of applied bias (+6 to −6 V) under dark conditions for grains market in the topographic AFM image c.