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. 2019 Jul 22;6:24. doi: 10.1186/s40580-019-0194-1

Fig. 4.

Fig. 4

Deconvoluted XPS spectra (M–O, VO, and M–OH) of O 1S in a IGZO channel region and b Al2O3 dielectric region before and after post-annealing. c XPS depth profile representing atomic percentages of M–O, VO, and M–OH before and after post-annealing of IGZO/Al2O3 layers