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. 2019 Jul 22;6:24. doi: 10.1186/s40580-019-0194-1

Fig. 5.

Fig. 5

a Variation in threshold voltage shift during a 100 DC cycling test (VD = 0.1 V) and b variation in the on and off current during a 5000 cycling test (@ VD = 10 V) before and after post-annealing of the IGZO transistor