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. 2018 Oct 15;3(10):13227–13238. doi: 10.1021/acsomega.8b02122

Table 1. Results of WPPM Modeling and Refinement from the X-ray Powder Diffraction Data, Including Unit Cell Parameters, Tetragonality (c/a), Crystalline Domain Diameters (Average, Mode, and Skewness of the log-Normal Size Distribution), and Dislocation Densities (Edge and Screw, ρe and ρs, Respectively) of Synthesized SnO2 NPs.

  agreement factors
unit cell parameters (nm)
  crystalline domain diameter (nm)
dislocation density (×1015 m–2)
synthesis temperature (°C) Rwp (%) Rexp (%) χ2 a = b (nm) c (nm) volume (nm3) c/a average mode skewness ρe ρs
160 2.25 1.38 1.64 0.4751(1) 0.3185(1) 0.072(1) 0.6703 3.4(1) 2.3(1) 1.7(1) 1.0(7) 1.3(1)
180 1.85 1.34 1.38 0.4749(1) 0.3186(1) 0.072(1) 0.6709 5.3(2) 3.1(1) 2.2(1) 1.0(5) 1.2(8)
200 2.20 1.68 1.31 0.4750(1) 0.3189(1) 0.072(1) 0.6713 6.2(4) 4.9(3) 1.3(1) 1.0(7) 1.4(1)
220 1.94 1.33 1.46 0.4748(1) 0.3190(1) 0.072(1) 0.6719 6.9(2) 5.7(2) 1.1(1) 1.0(1) 1.7(2)
240 2.03 1.34 1.51 0.4748(1) 0.3188(1) 0.072(1) 0.6714 7.2(3) 5.0(2) 1.7(1) 1.0(3) 1.9(5)
260 2.04 1.31 1.56 0.4749(1) 0.3189(1) 0.072(2) 0.6714 7.7(1) 6.7(1) 0.9(1) 1.0(5) 1.9(2)