Table 2. Definition of the Abbreviations Used To Determine the Trap-Assisted Auger Recombination Coefficients T_i Using Equation 15^a.

i	Ni	di1	di2	bi
1		13	–260
2		0.5(33 – 15σL)	0.5(33 – 15σL)
3
4

^aHere, E_g is the band gap, E_t is the trap depth with respect to the conduction band, σ = m_h/m_e is the ratio of the hole and electron effective mass, and σ_L = 1/σ. In this form, the notation is valid for free electrons in the conduction band interacting with defect states. For free holes in the valence band, E_t, σ, and σ_L have to be adjusted accordingly.