. 2017 Oct 9;2(10):6492–6499. doi: 10.1021/acsomega.7b01057

Table 2. XPS Quantification of Elements in the Graphene Sample Deposited on SiO₂ and Graphene Powder after TGA.

	C (%)	O (%)	N (%)	Fe (%)	Cr (%)	other (%)^a	C/N
graphene^b	96.6 ± 1.2	0.2 ± 1.1	1.5 ± 0.1	0.3 ± 0.0	0.2 ± 0.0	1.2	66
after TGA^c	88.3 ± 0.6	7.1 ± 0.9	0.2 ± 0.1	0.5 ± 0.0	0.2 ± 0.0	3.6	393

Contains Ca, F, and Cl.

Graphene deposited on SiO₂. The amount of oxygen was corrected for SiO₂ as O_corr. = O_meas. – 2 × Si_meas.

Graphene powder after TGA up to 1100 °C.

Table 2. XPS Quantification of Elements in the Graphene Sample Deposited on SiO2 and Graphene Powder after TGA.