Fig. 15. (a) J–V characteristics of DTB with a cross-sectional SEM image in the inset (scale bar: 200 nm); (b) evolution of PCE in air for PSC devices based on DTB. Reprinted with permission from ref. 167. (c) Grazing-incidence wide-angle X-ray scattering (GIWAXS) and atomic force microscopy (AFM) images of PTEG; (d) J–V curves for PTEG devices (planar-SnO2). Reprinted with permission from ref. 170. (e) The evolution of PCE for epoxy-encapsulated devices incorporating the PCDTBT1 HTM that have been stored under ambient conditions for a duration of 30 days. Reprinted with permission from ref. 171. (f) The J–V characteristics of perovskite solar cells with different polymer HTMs under AM 1.5G illumination; (g) unencapsulated device photostability tests under continuous one sun illumination in a home-built chamber filled with N2. PCE variation of the HTM stacks based on a C60-SAM with strong binding between the phosphonic acid and the oxide surface as the ETM: spiro-MeOTAD/MoOx/Au (yellow), PDCBT/MoOx/Au (green) and PDCBT/Ta-WOx/Au (black). Reprinted with permission from ref. 168.
