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. 2019 Jul 26;5(7):eaax1081. doi: 10.1126/sciadv.aax1081

Fig. 2. Characterization of single-cluster nanowires, nanorings, and 3D superstructures.

Fig. 2

(A) Typical TEM image of a POM nanowire. (B) High-resolution TEM (HRTEM) image of a single nanowire. (C) Typical transmission electron microscopy (TEM) image of a POM nanoring. (D) High-resolution aberration-corrected TEM image of nanorings. (E) TEM image of a small-size superstructure from the side face. (F) TEM image from the top view of the superstructure. (G) Low-magnification TEM image of a 3D superstructure in large size and the corresponding fast Fourier transform (FFT) image. (H) Dark-field HRTEM image of the superstructure. (I) Energy-dispersive x-ray (EDX) elemental mapping analysis of the superstructure.