Skip to main content
. 2019 May 16;7(12):10435–10444. doi: 10.1021/acssuschemeng.9b00738

Figure 1.

Figure 1

Atomic force microscopy (AFM) observation of PSI in PLGA microparticles. PLGA MPs visualized in three different modes: (a) Error-mode; (b) Semicontact; (c) 3D. The images have been acquired in dry mode.