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. 2019 Jul 11;12(14):2232. doi: 10.3390/ma12142232
ITO Sn-doped In2O3
FTO Fluorine-doped SnO2
AZO Al-doped ZnO
ALD atomic-layer-deposition
TMA trimethylaluminium
XPS X-ray photoelectron spectroscopy
XRD X-ray diffraction
GIXRD grazing incidence X-ray diffraction
RF radio frequency