| ITO | Sn-doped InO |
| FTO | Fluorine-doped SnO |
| AZO | Al-doped ZnO |
| ALD | atomic-layer-deposition |
| TMA | trimethylaluminium |
| XPS | X-ray photoelectron spectroscopy |
| XRD | X-ray diffraction |
| GIXRD | grazing incidence X-ray diffraction |
| RF | radio frequency |
| ITO | Sn-doped InO |
| FTO | Fluorine-doped SnO |
| AZO | Al-doped ZnO |
| ALD | atomic-layer-deposition |
| TMA | trimethylaluminium |
| XPS | X-ray photoelectron spectroscopy |
| XRD | X-ray diffraction |
| GIXRD | grazing incidence X-ray diffraction |
| RF | radio frequency |