Figure 2. Analysis of hydroxyapatite (HA) by the X-ray diffraction (XRD). (A) Upper left panel represents the chart of HA powder. Red chart represents the standard of HA (ICDD). Upper right panel indicates the effect of compressive force stress (500 MPa). Lower panels indicate the effect of shearing stress. (B) Panels indicate the effect of sintering temperature (1073 K and 1373 K).
