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. 2019 Aug 15;9:11926. doi: 10.1038/s41598-019-48449-x

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© The Author(s) 2019

Open Access This article is licensed under a Creative Commons Attribution 4.0 International License, which permits use, sharing, adaptation, distribution and reproduction in any medium or format, as long as you give appropriate credit to the original author(s) and the source, provide a link to the Creative Commons license, and indicate if changes were made. The images or other third party material in this article are included in the article’s Creative Commons license, unless indicated otherwise in a credit line to the material. If material is not included in the article’s Creative Commons license and your intended use is not permitted by statutory regulation or exceeds the permitted use, you will need to obtain permission directly from the copyright holder. To view a copy of this license, visit http://creativecommons.org/licenses/by/4.0/.

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Brightfield images and G-band confocal Raman intensity maps of (a) purified SWCNTs and (c) (GT)₁₅-SWCNTs dried on silicon wafers before and after a 30-minute exposure to 400 °C. The average spectra of SWCNT-containing pixels in confocal Raman area scans of (a,c) are shown in (b,d) respectively. Average Raman spectra zoomed-in to show detail in (e) normalized RBM, (f) D-band, and (g) G-band of (GT)₁₅-SWCNTs at room temperature and after a 30-minute exposure to 400 °C. Scale Bar = 100 μm.