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. 2019 Aug 16;5(8):eaav3489. doi: 10.1126/sciadv.aav3489

Fig. 3. Transparent solution-processed nylon-11 thin films.

Fig. 3

Tapping mode AFM height image of the (A) conventionally spin-coated and (B) SQ thin films. (C) Ultraviolet-visible absorption as a function of wavelength on a double logarithmic scale of the conventionally spin-coated thin film and the SQ thin films. The dashed lines are the calculated absorbance using Eq. 1. The inset shows optical quality of the SQ thin films; the images of the logo of the Max Planck Institute for Polymer Research are taken through the SQ thin film (left) and the conventionally spin-coated films (right). Photo credit: Saleem Anwar, Max Planck Institute for Polymer Research. (D) Evolution of the roughness of the conventionally spin-coated and the SQ thin film upon variation in thicknesses. The RMS roughness is measured by AFM height topography, while calculated roughness is determined using optical absorption measurement. The calculated roughness agrees well with the experimental roughness obtained by AFM. The dashed lines are guide to the eye.