TABLE I.
Buckling without bending model | Conventional elastic bilayer model | |
---|---|---|
Phase relationship between film thickness and substrate deformation (the planar limit t/r → 0 is shown for simplicity) | ||
Amplitude of film thickness oscillations | = [(1 − ∊)/∊]×wrinkling amplitude | ≪ wrinkling amplitude |
Wave number q = (2π〈r〉)/λ | ~(〈r〉/t)(Ef/Es)−1/3 | |
Near morphogenesis onset, the number of wrinkles q is independent of | Geometry | Differential strain (in excess of critical strain) |
To generate more wrinkles | Increase growth potential kt or decrease gradient penalty β | Decrease film thickness (relative to system size) or decrease stiffness contrast Ef/Es |
Proxy for time in developmental dynamics | ∊ (see Ref. [27] for more details) | Differential strain |
Minimal input physics in the form of dimensionless parameters | (i) Effective radial spring constant kr/μ(= ∊−1) presumably coming from system-spanning radial glia fibers (ii) Growth potential kt/μ of the film (iii) Thickness gradient penalty β/μ presumably coming from film-spanning fibers, e.g., Bergmann glia (iv) Preferred geometry (v) Reference geometry t0/r0 |
(i) Stiffness contrast Ef/Es of two homogeneous elastic materials (ii) Zero-strain geometry (iii) Differential strain eθθ |