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. 2019 Aug 23;14(8):e0221491. doi: 10.1371/journal.pone.0221491

Fig 6.

Fig 6

Surface properties of Ti samples; AFM topography of samples in 20*20 μm2 area, (a) A, (b) SA, (c) 4E, and (d) S4E sample; (e) contact angle results of Ti samples; (f) SEM micrograph of SMATed as-received Ti (SA) sample showing the SMAT effected zone full of micrometer ranged cracks and pores.