Table 4.
Parameters | Description |
---|---|
τ SRH | 0.1, 0.5, 1 and 10 ms |
contact srv | 10 cm/s |
w pcon | 140 μm |
w ncon | 10 μm |
w pn | 1 μm |
w pdop | 1.1wpcon |
w ndop | 1.1wncon |
bulk acceptor doping | 5 × 1015 cm−3 |
N p0 | 4 × 1018 cm−3 |
σ p | 100 nm |
N n0 | 2 × 1018 cm−3 |
σ n | 220 nm |
The Auger recombination of the carriers are described by improved Auger model of11. The BGN of Si and surface recombination at Si − SiO2 interface are modeled according to the details illustrated in the “Methods” section.