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. 2019 Jul 31;9(8):1099. doi: 10.3390/nano9081099

Figure 5.

Figure 5

(a) TEM micrograph of sample ZC2. Dotted lines indicate two ZnO NPs with different orientations; (b,d) STEM micrographs of a ZnO NPs exposing an in-plane (b) and out-of-plane (d) view of 0001 planes; (c,e) High-resolution STEM micrographs relative to (b) and (d) respectively.