Table 1.

Means and standard deviations of baseline-to-peak Go trial ERP component amplitudes in microvolts, and averaged response times (RT) in milliseconds for each session.

	Session 1	Session 2	Difference	Test-retest Reliability
	M (SD)	M (SD)	t	r
N1	−6.86 (4.55)	−6.51 (4.42)	−.86	.60***
P2	9.06 (4.85)	8.35 (5.46)	1.48	.59***
N2	−7.05 (6.40)	−8.06 (6.20)	1.61	.53***
P3	10.78 (6.19)	8.68 (5.30)	3.27**	.41***
E-wave	−2.30 (5.07)	−4.03 (5.24)	2.89**	.35***
RT	290.76 (103.64)	288.02 (127.39)	.44	.81***

Note:

^*p < .05

^**p < .01

^***p < .001

N = 96 due to listwise deletion for analyses in SPSS.