. 2019 Aug 26;4(11):14589–14598. doi: 10.1021/acsomega.9b01958

Table 1. Compositional/Quantificational Analysis from XPS, Crystallite Size from XRD, and (I_D/I_G) Ratio from Raman Spectra of SiO₂-NPs, MWCNTs, MWCNTs/SiO₂-NPs (Si-NPs = 1.5 atom %), and MWCNTs/SiO₂-NPs (Si-NPs = 5.75 atom %).

	compositional and quantificational analysis from XPS
	C (atom %)	O (atom %)	Si (atom %)	wt % of oxidized Si-NPs on MWCNTs surface obtained from XPS	(I_D/I_G) ratio	L_a (nm) from XRD	L_a (nm) from Raman
SiO₂-NPs		63.60	36.40
MWCNTs	98.37	01.63			1.3	2.8	3.8
MWCNTs/SiO₂-NPs (Si-NPs = 1.5 atom %)	94.00	4.50	1.50	3.42	1.5	2.6	3.4
MWCNTs/SiO₂-NPs (Si-NPs = 5.75 atom %)	85.0	9.25	5.75	12.15	0.74	5.1	6.8

Table 1. Compositional/Quantificational Analysis from XPS, Crystallite Size from XRD, and (ID/IG) Ratio from Raman Spectra of SiO2-NPs, MWCNTs, MWCNTs/SiO2-NPs (Si-NPs = 1.5 atom %), and MWCNTs/SiO2-NPs (Si-NPs = 5.75 atom %).