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. 2019 May 9;19(6):3597–3602. doi: 10.1021/acs.nanolett.9b00558

Figure 1.

Figure 1

FIB fabrication of an Au tip and STL spectra. (a,b) SEM images of an Au tip before and after FIB milling. (c) Magnified SEM image of the tip apex of the FIB fabricated tip. (d) Bias voltage dependence of STL spectra measured over the Ag(111) surface with the FIB-tip (It = 9 nA, Vbias is indicated in the figure).