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. 2019 Sep 19;12(18):3038. doi: 10.3390/ma12183038

Figure 2.

Figure 2

2θθ scans for N:Cu2O thin films on quartz in the range (a) 30°–75° and (b) 35°–45°. The asterisk * indicates the peak of the quartz substrate, whereas Δ indicates the peaks of the sample holder.