Skip to main content
. Author manuscript; available in PMC: 2019 Oct 4.
Published in final edited form as: Appl Sci (Basel). 2018 Jan 22;8(1):144. doi: 10.3390/app8010144

Figure 4: |. Controlling the propagation distance of the SPP waveguide mode with the top SiO2 layer’s thickness.

Figure 4: |

(a)- (d) the thickness of the top dielectric layer is t = 160 nm, (e) - (h) the thickness of the top dielectric layer is t =180 nm, (i)-(l) the thickness of the top dielectric layer is 250 nm. The incident wavelength varied from 580 to 640 nm with 20 nm step as labelled from (a) to (l). The scale bar in (a) is also applicable for the images in (b)–(l). The dimeter of the Ag NW is about 70 nm on all these images. (m) Simulated band structure of the multilayer and dispersion relation of the SPP waveguide mode. The projected photonic band structure of the dielectric multilayer for TE polarization. The yellow zone denotes the stop band. The solid lines denote the dispersion relations of BSW modes with different thickness of the top SiO2 layer (t =160, 180, 250 nm). The diameter of Ag nanowire is 70 nm.