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. 2019 Oct 10;9:14651. doi: 10.1038/s41598-019-50996-2

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© The Author(s) 2019

Open Access This article is licensed under a Creative Commons Attribution 4.0 International License, which permits use, sharing, adaptation, distribution and reproduction in any medium or format, as long as you give appropriate credit to the original author(s) and the source, provide a link to the Creative Commons license, and indicate if changes were made. The images or other third party material in this article are included in the article’s Creative Commons license, unless indicated otherwise in a credit line to the material. If material is not included in the article’s Creative Commons license and your intended use is not permitted by statutory regulation or exceeds the permitted use, you will need to obtain permission directly from the copyright holder. To view a copy of this license, visit http://creativecommons.org/licenses/by/4.0/.

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Semi-analytic calculation of the expected SD-OCT signal for a sample of three reflective layers and an arm length detuning $Δ s = 10 mm$ at the source interferometer. (a) OCT-signal in case the reference and sample arm lengths $z_{r}$ and $z_{s}$ approximately match. The effect of finite spectral resolution is neglegted. The dashed line indicates the axial signal drop due to the finite resolution of the spectrograph which is modelled by the product of a Gaussian and a sinc function. (b) Phase of the A-scan signal in case the phase difference $Δ φ$ at the source interferometer is changed. The data is thresholded to signal components with amplitude larger than −60 dB. (c and d) A-scan amplitude and phase in case the reference arm length $z_{r}$ is shortened by 1.5 mm. (e and f) A-scan amplitude and phase in case the reference arm is shortened by 10 mm, matching the arm length detuning Δs at the source interferometer.