Figure 3.

(a,b) SEM images of a nanotube before and after the deposition of a particle with a mass m_dep = 1.33 fg determined by the resonance frequency measurement. (c) High-angle annular dark-field (HAADF) STEM image of the particle. The visible darker shell is likely the result of the subsequent manipulation of the nanotube with the electron beam (see text). (d) Thickness map of the particle determined by low-loss EELS using the elemental composition of Table 1 and the log-ratio method.³⁸