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. 2019 Oct 11;10:4645. doi: 10.1038/s41467-019-12615-6

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© The Author(s) 2019

Open Access This article is licensed under a Creative Commons Attribution 4.0 International License, which permits use, sharing, adaptation, distribution and reproduction in any medium or format, as long as you give appropriate credit to the original author(s) and the source, provide a link to the Creative Commons license, and indicate if changes were made. The images or other third party material in this article are included in the article’s Creative Commons license, unless indicated otherwise in a credit line to the material. If material is not included in the article’s Creative Commons license and your intended use is not permitted by statutory regulation or exceeds the permitted use, you will need to obtain permission directly from the copyright holder. To view a copy of this license, visit http://creativecommons.org/licenses/by/4.0/.

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Fig. 5 — Crystallographic characterisation of the Bi_xSn_1−x nano-alloys. a–d DF-TEM images of individual particle of different Bi–Sn nano-alloy samples. Scale bars: 20 nm. e–h BF-HR-TEM images of the nano-alloys with their grain boundaries outlined. The insets present their respective grain size distribution. Scale bars: 5 nm. i, j BF-HR-TEM images showing line defects (edge dislocations) indicated by T-shape symbols that observed in the eutectic nano-alloys. Scale bars: 1 nm. k, l TEM image of a eutectic nano-alloy particle (k), scale bar: 20 nm, and an illustration shows its heterostructures based on the characterisation results (l)