Table 1. Specifications of the Ti:sapphire laser system at the beamlines and their available laser parameters.

Experimental hall	HX		SX
Beamline	XSS	NCI	SSS
Repetition rate (MHz) (oscillator)	79.33
Repetition rate (Hz) (amplifier)	<120		<1080
Fundamental wavelength (nm)	800
Pulse duration (fs) (FWHM)	100		40
Maximum pulse energy at sample position	5 mJ at 800 nm		4 mJ at 800 nm
	1 mJ at 400 nm		1 mJ at 400 nm
	0.7 mJ at 266 nm		0.5 mJ at 266 nm
Optical parametric amplifier	240–2600 nm	None
Incident angle to the XFEL	Non-collinear (∼10°)	CXI†: non-collinear (∼15°)	Collinear (∼1°)
	Collinear (∼1°)	SFX: perpendicular (∼90°)

^†CXI: coherent X-ray imaging.