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. 2019 Oct 16;9:14859. doi: 10.1038/s41598-019-49906-3

Figure 3.

Figure 3

Typical two-dimensional atomic force microscopy (AFM) surface profiles (Scan size was 20 × 20 μm) and eight-level height profiles along the blue lines in the AFM images: (a) silicon master stamp and (b) patterned HSQ multi-layer.