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. 2019 Oct 25;5(10):eaaw6619. doi: 10.1126/sciadv.aaw6619

Fig. 1. Nano-FTIR analysis of OIHP films.

Fig. 1

(A) Synchrotron broadband IR radiation is focused onto a metallic tip that tightly confines the fields at its apex for further interaction with the sample surface in standard tapping-mode AFM. AFM mapping retrieves nanoscale morphology (B) and IR broadband intensity (C) of individual grains in the ~150-nm-thick OIHP film. The IR broadband image (C) reveals changes in the vibrational response of specific OIHP grain boundaries that are further associated to early stages of organic depletion in the film. Scale bar, 200 nm.