Table 2.
Results from X-ray photoelectron spectroscopy analysis for 2D and 3D coatings showing silicon, nitrogen, N/Si ratio, oxygen and carbon at.%. The quantification accuracy of XPS is typically around ±5% for elements <10 at.% and ±2%–3 % for elements >10 at.%.
| Substrate | Process | Si (at.%) | N (at.%) | N/Si | O (at.%) | C (at.%) |
|---|---|---|---|---|---|---|
| CoCrMo disc | 2D-1f-H0-P3.4 | 49.2 | 46.7 | 0.95 | 2.3 | 0.5 |
| 2D-1f-H3-P3.4 | 47.4 | 48.8 | 1.03 | 1.7 | 0.8 | |
| 2D-1f-H0-P3.4-rep | 48.49 | 44.19 | 0.91 | 6.51 | 0.81 | |
| 2D-3f-H0-P3.4 | 46.1 | 37.8 | 0.82 | 14.2 | 1.87 | |
| CoCrMo hip head 32 and 36 mm |
3D-3f-H0-P3.4 | 46.1 | 37.8 | 0.82 | 14.2 | 1.87 |
| 3D-3f-H0-P1.7 | 41.6 | 39.4 | 0.95 | 16.5 | 2.52 | |
| 3D-3f-H3-P3.4-C | 40.6 | 31.5 | 0.78 | 12.2 | 15.7 |