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. 2019 Oct 15;7(10):e2466. doi: 10.1097/GOX.0000000000002466

Fig. 7.

Fig. 7.

(A) SmoothSilk/SilkSurface 3D topography view taken with uSurf Mobile Profilometer per ISO 25178-2:2012. (B) SmoothSilk/SilkSurface scanning electron microscopy image at a scale of 1 mm and ×55 magnification. Results property of Establishment Labs.